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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Conference Papers(학술회의논문)

Novel cross-correlation algorithm for reducing noise-related errors in array type Optical triangulation displacement sensors

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dc.contributor.authorKim K.-C.ko
dc.contributor.authorSe Baek Ohko
dc.contributor.authorKim, Soohyunko
dc.contributor.authorKwak, Yoon Keunko
dc.date.accessioned2013-03-16T07:31:42Z-
dc.date.available2013-03-16T07:31:42Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2001-01-24-
dc.identifier.citationTesting, Reliability, and Applications of Optoelectronic Devices, pp.95 - 101-
dc.identifier.urihttp://hdl.handle.net/10203/128894-
dc.languageEnglish-
dc.publisherSPIE-
dc.titleNovel cross-correlation algorithm for reducing noise-related errors in array type Optical triangulation displacement sensors-
dc.typeConference-
dc.identifier.wosid000169941700012-
dc.identifier.scopusid2-s2.0-0034938002-
dc.type.rimsCONF-
dc.citation.beginningpage95-
dc.citation.endingpage101-
dc.citation.publicationnameTesting, Reliability, and Applications of Optoelectronic Devices-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationSan Jose, CA-
dc.contributor.localauthorKim, Soohyun-
dc.contributor.localauthorKwak, Yoon Keun-
dc.contributor.nonIdAuthorKim K.-C.-
dc.contributor.nonIdAuthorSe Baek Oh-
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ME-Conference Papers(학술회의논문)
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