Degradation mechanism of low voltage cathodoluminescence of ZnS : Ag,Cl phosphors screen under the panel sealing process

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dc.contributor.authorPark, ZMko
dc.contributor.authorJeon, DukYoungko
dc.contributor.authorCha, SNko
dc.contributor.authorJin, YWko
dc.contributor.authorKim, JMko
dc.date.accessioned2013-03-16T07:03:50Z-
dc.date.available2013-03-16T07:03:50Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2001-08-12-
dc.identifier.citationProceedings of the 14th International Vacuum Microelectronics Conference, pp.197 - 198-
dc.identifier.urihttp://hdl.handle.net/10203/128656-
dc.languageEnglish-
dc.publisherInternational Vacuum Microelectronics Conference-
dc.titleDegradation mechanism of low voltage cathodoluminescence of ZnS : Ag,Cl phosphors screen under the panel sealing process-
dc.typeConference-
dc.identifier.wosid000172068300099-
dc.identifier.scopusid2-s2.0-0035784653-
dc.type.rimsCONF-
dc.citation.beginningpage197-
dc.citation.endingpage198-
dc.citation.publicationnameProceedings of the 14th International Vacuum Microelectronics Conference-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationDavis, CA-
dc.contributor.localauthorJeon, DukYoung-
dc.contributor.nonIdAuthorPark, ZM-
dc.contributor.nonIdAuthorCha, SN-
dc.contributor.nonIdAuthorJin, YW-
dc.contributor.nonIdAuthorKim, JM-
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