Correction of distortions in confocal scanning laser microscopy as quality measurement devices; nonlinear scanning velocity
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Gweon, Dae-Gab | - |
| dc.date.accessioned | 2013-03-16T04:32:00Z | - |
| dc.date.available | 2013-03-16T04:32:00Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2000-10 | - |
| dc.identifier.citation | ISIM 2000, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/127483 | - |
| dc.language | ENG | - |
| dc.title | Correction of distortions in confocal scanning laser microscopy as quality measurement devices; nonlinear scanning velocity | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | ISIM 2000 | - |
| dc.contributor.localauthor | Gweon, Dae-Gab | - |
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