DC Field | Value | Language |
---|---|---|
dc.contributor.author | Choi G.-P. | - |
dc.contributor.author | Kim, Ho Gi | - |
dc.date.accessioned | 2013-03-16T04:20:20Z | - |
dc.date.available | 2013-03-16T04:20:20Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2000-03-12 | - |
dc.identifier.citation | 12th International Symposium on Integrated Ferroelectrics, v.33, no.40547, pp. - | - |
dc.identifier.issn | 1058-4587 | - |
dc.identifier.uri | http://hdl.handle.net/10203/127397 | - |
dc.language | ENG | - |
dc.title | Effects of interface state on electrical properties of SBT thin films | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-0035037655 | - |
dc.type.rims | CONF | - |
dc.citation.volume | 33 | - |
dc.citation.issue | 40547 | - |
dc.citation.publicationname | 12th International Symposium on Integrated Ferroelectrics | - |
dc.identifier.conferencecountry | Germany | - |
dc.identifier.conferencecountry | Germany | - |
dc.contributor.localauthor | Kim, Ho Gi | - |
dc.contributor.nonIdAuthor | Choi G.-P. | - |
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