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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Analysis of Critical Race Combined Circuit with Timed Discrete Event Model

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dc.contributor.authorLee, MS-
dc.contributor.authorCho, Kwang-Hyun-
dc.contributor.authorLim, Jong-Tae-
dc.date.accessioned2013-03-16T03:31:09Z-
dc.date.available2013-03-16T03:31:09Z-
dc.date.created2012-02-06-
dc.date.issued1999-10-
dc.identifier.citation4th International Conference On Mechatronic Technology, v., no., pp.538 - 540-
dc.identifier.urihttp://hdl.handle.net/10203/127015-
dc.languageENG-
dc.titleAnalysis of Critical Race Combined Circuit with Timed Discrete Event Model-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage538-
dc.citation.endingpage540-
dc.citation.publicationname4th International Conference On Mechatronic Technology-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorCho, Kwang-Hyun-
dc.contributor.localauthorLim, Jong-Tae-
dc.contributor.nonIdAuthorLee, MS-
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BiS-Conference Papers(학술회의논문)EE-Conference Papers(학술회의논문)
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