Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in atomic force microscope based memory device
- Issue Date
- 2000-01-01
- Language
- ENG
- Citation
IEEE international symposium on the applications of ferroelectrics (ISAF 2000)
- Appears in Collection
- MS-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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