DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park Min-Cheol | ko |
dc.contributor.author | Kim, Seung-Woo | ko |
dc.date.accessioned | 2013-03-16T00:02:44Z | - |
dc.date.available | 2013-03-16T00:02:44Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2000-11-08 | - |
dc.identifier.citation | Instruments for Optics and Optoelectronic Inspection and Control, pp.259 - 262 | - |
dc.identifier.uri | http://hdl.handle.net/10203/125352 | - |
dc.language | English | - |
dc.publisher | SPIE | - |
dc.title | Compensation of phase change upon reflection in white light interferometry | - |
dc.type | Conference | - |
dc.identifier.wosid | 000167117400061 | - |
dc.identifier.scopusid | 2-s2.0-0034429548 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 259 | - |
dc.citation.endingpage | 262 | - |
dc.citation.publicationname | Instruments for Optics and Optoelectronic Inspection and Control | - |
dc.identifier.conferencecountry | CC | - |
dc.identifier.conferencelocation | Beijing, China | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Park Min-Cheol | - |
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