Compensation of phase change upon reflection in white light interferometry

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dc.contributor.authorPark Min-Cheolko
dc.contributor.authorKim, Seung-Wooko
dc.date.accessioned2013-03-16T00:02:44Z-
dc.date.available2013-03-16T00:02:44Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2000-11-08-
dc.identifier.citationInstruments for Optics and Optoelectronic Inspection and Control, pp.259 - 262-
dc.identifier.urihttp://hdl.handle.net/10203/125352-
dc.languageEnglish-
dc.publisherSPIE-
dc.titleCompensation of phase change upon reflection in white light interferometry-
dc.typeConference-
dc.identifier.wosid000167117400061-
dc.identifier.scopusid2-s2.0-0034429548-
dc.type.rimsCONF-
dc.citation.beginningpage259-
dc.citation.endingpage262-
dc.citation.publicationnameInstruments for Optics and Optoelectronic Inspection and Control-
dc.identifier.conferencecountryCC-
dc.identifier.conferencelocationBeijing, China-
dc.contributor.localauthorKim, Seung-Woo-
dc.contributor.nonIdAuthorPark Min-Cheol-
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ME-Conference Papers(학술회의논문)
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