Energetics of N-Related Defects in Zn-Based II-VI Semiconductors
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chang, Kee-Joo | - |
| dc.date.accessioned | 2013-03-15T22:30:03Z | - |
| dc.date.available | 2013-03-15T22:30:03Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1995-01-01 | - |
| dc.identifier.citation | 22nd International Symposium on Compound Semiconductors, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/124587 | - |
| dc.language | ENG | - |
| dc.publisher | IOP | - |
| dc.title | Energetics of N-Related Defects in Zn-Based II-VI Semiconductors | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 22nd International Symposium on Compound Semiconductors | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Chang, Kee-Joo | - |
- Appears in Collection
- PH-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.