DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ham, Dong H. | - |
dc.contributor.author | Yoon, Wan Chul | - |
dc.date.accessioned | 2013-03-15T21:44:37Z | - |
dc.date.available | 2013-03-15T21:44:37Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1996-06 | - |
dc.identifier.citation | 96 APDSI, v., no., pp.937 - 944 | - |
dc.identifier.uri | http://hdl.handle.net/10203/124193 | - |
dc.language | ENG | - |
dc.title | The Effects of Principle Knowledge in Novel Fault Diagnosis | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 937 | - |
dc.citation.endingpage | 944 | - |
dc.citation.publicationname | 96 APDSI | - |
dc.identifier.conferencecountry | Hong Kong | - |
dc.identifier.conferencecountry | Hong Kong | - |
dc.contributor.localauthor | Yoon, Wan Chul | - |
dc.contributor.nonIdAuthor | Ham, Dong H. | - |
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