LBIC 측정을 이용한 HgCdTe Diode 의 특성분석

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dc.contributor.author김충기-
dc.date.accessioned2013-03-15T21:09:07Z-
dc.date.available2013-03-15T21:09:07Z-
dc.date.created2012-02-06-
dc.date.issued1998-
dc.identifier.citation적외선 영상 샌서 Conference, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/123908-
dc.languageKOR-
dc.titleLBIC 측정을 이용한 HgCdTe Diode 의 특성분석-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname적외선 영상 샌서 Conference-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthor김충기-
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EE-Conference Papers(학술회의논문)
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