DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jang, KW | ko |
dc.contributor.author | Kim, HJ | ko |
dc.contributor.author | Kwon, WS | ko |
dc.contributor.author | Paik, Kyung-Wook | ko |
dc.date.accessioned | 2007-09-03T06:40:03Z | - |
dc.date.available | 2007-09-03T06:40:03Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-05-31 | - |
dc.identifier.citation | 55th Electronic Components and Technology Conference, ECTC, pp.1486 - 1490 | - |
dc.identifier.issn | 0569-5503 | - |
dc.identifier.uri | http://hdl.handle.net/10203/1237 | - |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | IEEE | - |
dc.title | Internal stresses evolution of non conductive pastes (NCPs) and underfill materials for flip chip applications | - |
dc.type | Conference | - |
dc.identifier.wosid | 000230581600231 | - |
dc.identifier.scopusid | 2-s2.0-24644504236 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 1486 | - |
dc.citation.endingpage | 1490 | - |
dc.citation.publicationname | 55th Electronic Components and Technology Conference, ECTC | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Lake Buena Vista, FL | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Paik, Kyung-Wook | - |
dc.contributor.nonIdAuthor | Jang, KW | - |
dc.contributor.nonIdAuthor | Kim, HJ | - |
dc.contributor.nonIdAuthor | Kwon, WS | - |
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