Positron Annihilation Technique for the Detection of Defects in High Purity Titanium
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, In Sup | - |
| dc.date.accessioned | 2013-03-15T20:54:54Z | - |
| dc.date.available | 2013-03-15T20:54:54Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1995 | - |
| dc.identifier.citation | in Proc. of the Second Pacific Rim International Conference on Advanced Materials and Processing(PRICM-2), Advanced Materials and Pforcessing, ed. by K.S Shin, J.K. Yoon and S.J. Kim, The Korean Institute of Metals and Materials, v., no., pp.1159 - 1164 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/123776 | - |
| dc.language | ENG | - |
| dc.title | Positron Annihilation Technique for the Detection of Defects in High Purity Titanium | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 1159 | - |
| dc.citation.endingpage | 1164 | - |
| dc.citation.publicationname | in Proc. of the Second Pacific Rim International Conference on Advanced Materials and Processing(PRICM-2), Advanced Materials and Pforcessing, ed. by K.S Shin, J.K. Yoon and S.J. Kim, The Korean Institute of Metals and Materials | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Kim, In Sup | - |
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