DC Field | Value | Language |
---|---|---|
dc.contributor.author | No, Hee Cheon | - |
dc.contributor.author | Song, CH | - |
dc.contributor.author | Chung, MK | - |
dc.date.accessioned | 2013-03-15T20:50:29Z | - |
dc.date.available | 2013-03-15T20:50:29Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1997 | - |
dc.identifier.citation | Proc. of the OECD/CSNI SPecialist Meeting on Advanced Instrumentation and Measurement Techniques, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/123741 | - |
dc.language | ENG | - |
dc.title | Measurements of Void Fraction by an Improved Multi-Channel Conductance Void Meter | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | Proc. of the OECD/CSNI SPecialist Meeting on Advanced Instrumentation and Measurement Techniques | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | No, Hee Cheon | - |
dc.contributor.nonIdAuthor | Song, CH | - |
dc.contributor.nonIdAuthor | Chung, MK | - |
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