The measurement of Pockels coefficient of PZT thin films using two-beams polarization interferometer with reflection configuration
- Publisher
- PACRIM
- Issue Date
- 1998-01-01
- Language
- ENG
- Citation
PACRIM 3
- Appears in Collection
- MS-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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