LBIC(Laser Beam Induced Current) 측정을 이용한 HgCdTe diode의 특성 분석

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Issue Date
1998
Language
KOR
Citation

제 9회 HgCdTe 반도체 Conference

URI
http://hdl.handle.net/10203/122720
Appears in Collection
EE-Conference Papers(학술회의논문)
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