Raman scattering from $F^+$-implanted Si

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dc.contributor.authorKim, Jong Jean-
dc.date.accessioned2013-03-15T18:23:09Z-
dc.date.available2013-03-15T18:23:09Z-
dc.date.created2012-02-06-
dc.date.issued1996-
dc.identifier.citationProc. of the XV the Int'l Conf. on Raman Spectroscopy(John-Wiley and Sons), v., no., pp.936 - 937-
dc.identifier.urihttp://hdl.handle.net/10203/122384-
dc.languageENG-
dc.titleRaman scattering from $F^+$-implanted Si-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage936-
dc.citation.endingpage937-
dc.citation.publicationnameProc. of the XV the Int'l Conf. on Raman Spectroscopy(John-Wiley and Sons)-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorKim, Jong Jean-
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PH-Conference Papers(학술회의논문)
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