ECR thermal oxidation을 이용한 Bottom gate poly-Si TFT의 제작 및 특성 분석

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 181
  • Download : 0
Issue Date
1995
Language
KOR
Citation

한국반도체학술대회

URI
http://hdl.handle.net/10203/121869
Appears in Collection
RIMS Conference Papers
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0