DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yoon, Giwan | - |
dc.date.accessioned | 2013-03-15T16:54:40Z | - |
dc.date.available | 2013-03-15T16:54:40Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1995-04 | - |
dc.identifier.citation | Electrochemical Society Meeting Proceeding, v., no., pp.495 - 503 | - |
dc.identifier.uri | http://hdl.handle.net/10203/121540 | - |
dc.language | ENG | - |
dc.publisher | Electrochemical Society Meeting Proceeding | - |
dc.title | Process dependence of MOSFET performance and reliability with N2O-based furnace-growth gate oxides | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 495 | - |
dc.citation.endingpage | 503 | - |
dc.citation.publicationname | Electrochemical Society Meeting Proceeding | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Yoon, Giwan | - |
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