Statistical Analysis of Polysilicon Thin Film Transistor Load SRAM Sensitivity to Device Parameter
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chul-Hi Han | - |
| dc.date.accessioned | 2013-03-15T15:31:25Z | - |
| dc.date.available | 2013-03-15T15:31:25Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1997 | - |
| dc.identifier.citation | Technical digest of International Conference on VLSI and CAD, v., no., pp.74 - 76 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/120789 | - |
| dc.language | ENG | - |
| dc.title | Statistical Analysis of Polysilicon Thin Film Transistor Load SRAM Sensitivity to Device Parameter | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 74 | - |
| dc.citation.endingpage | 76 | - |
| dc.citation.publicationname | Technical digest of International Conference on VLSI and CAD | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Chul-Hi Han | - |
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