Characterization of InGaN/GaN lasing structures for high temperature device applications

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Issue Date
1998
Language
ENG
Citation

Proceedings of Conference on Laser and Electro-Optics (CLEO)/IQEC’98, OSA Technical Digest Series, pp.223 -

URI
http://hdl.handle.net/10203/120430
Appears in Collection
PH-Conference Papers(학술회의논문)
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