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Line laser lock-in thermography for instantaneous imaging of cracks in semiconductor chips An, Yun-Kyu; Yang, Jinyeol; Hwang, Soonkyu; Sohn, Hoon, OPTICS AND LASERS IN ENGINEERING, v.73, pp.128 - 136, 2015-10 |
Noncontact laser ultrasonic wavefield imaging and laser lock-in thermography techniques for structural damage detection = 구조물 손상 감지를 위한 비접촉식 레이저 초음파장 이미징 및 레이저 위상잠금 열화상 기법link An, Yun-Kyu; 안윤규; et al, 한국과학기술원, 2013 |
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