Showing results 1 to 2 of 2
Femtosecond laser ultrasonic inspection of a moving object and its application to estimation of silicon wafer coating thickness Yi, Kiyoon; Liu, Peipei; Park, Seong-Hyun; Sohn, Hoon, OPTICS AND LASERS IN ENGINEERING, v.148, 2022-01 |
Silicon wafer crack detection using nonlinear ultrasonic modulation induced by high repetition rate pulse laser Jang, Jinho; Liu, Peipei; Kim, Byunggi; Kim, Seung-woo; Sohn, Hoon, OPTICS AND LASERS IN ENGINEERING, v.129, 2020-06 |
Discover