Showing results 8 to 10 of 10
The effect of through-the-thickness holes on a reference-free damage diagnosis technique Lee, Chang Gil; Sohn, Hoon, SPIE International Symposia, Smart Structures & Materials and Nondestructive Evaluation for Health Monitoring and Diagnostics, SPIE, 2008-03-09 |
Transfer impedance-based crack detection without baseline date Park, Seunghee; Lee, Chang Gil; Sohn, Hoon, The 4th International Conference on Advances in Structural Engineering and Mechanics, Advances in Structural Engineering and Mechanics, 2008-05-26 |
Transition from guided wave based non-destructive testing to structural health monitoring Sohn, Hoon; Kim, Seung Bum; Lee, Sang Jun; Dutta, Debaditya; Park, Hyun Jun; Lee, Chang Gil; Agrawal, Abhinav; et al, 35th Annual Review of Progress in Quantitative Nondestructive Evaluation, QNDE, 2008-07-20 |
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