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Reference-free Coating Thickness Quantification using Laser Thermography under Various Exterior Temperature Conditions Hwang, Soonkyu; Park, Jiho; Jin, Z.; Sohn, Hoon, 14th Quantitative Infrared Thermography Conference (QIRT), pp.369 - 375, Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP, 2018-06-26 |
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