On-Wafer Pump-Probe Photoconductive Sampling for Millimeter Wave Passive Device Testing
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Joungho | - |
| dc.contributor.author | Lee, J | - |
| dc.contributor.author | Lee, HS | - |
| dc.date.accessioned | 2013-03-15T13:11:49Z | - |
| dc.date.available | 2013-03-15T13:11:49Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1998-02 | - |
| dc.identifier.citation | 5th International Workshop on Femtosecond Technology, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/119744 | - |
| dc.language | ENG | - |
| dc.title | On-Wafer Pump-Probe Photoconductive Sampling for Millimeter Wave Passive Device Testing | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 5th International Workshop on Femtosecond Technology | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.contributor.localauthor | Kim, Joungho | - |
| dc.contributor.nonIdAuthor | Lee, J | - |
| dc.contributor.nonIdAuthor | Lee, HS | - |
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