Diffusion barrier properties of the TiN films prepared by ECR PECVD method.

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dc.contributor.authorPark, Hye-Lyunko
dc.contributor.authorJang, Seong-Sooko
dc.contributor.authorLee, Won-Jongko
dc.date.accessioned2013-03-15T13:00:15Z-
dc.date.available2013-03-15T13:00:15Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1998-04-13-
dc.identifier.citationProceedings of the 1998 MRS Spring Symposium, pp.409 - 0-
dc.identifier.issn0272-9172-
dc.identifier.urihttp://hdl.handle.net/10203/119672-
dc.languageEnglish-
dc.publisherMRS-
dc.titleDiffusion barrier properties of the TiN films prepared by ECR PECVD method.-
dc.typeConference-
dc.identifier.wosid000077430000070-
dc.identifier.scopusid2-s2.0-0032303787-
dc.type.rimsCONF-
dc.citation.beginningpage409-
dc.citation.endingpage0-
dc.citation.publicationnameProceedings of the 1998 MRS Spring Symposium-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationSan Francisco, CA, USA-
dc.contributor.localauthorLee, Won-Jong-
dc.contributor.nonIdAuthorPark, Hye-Lyun-
dc.contributor.nonIdAuthorJang, Seong-Soo-
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MS-Conference Papers(학술회의논문)
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