Quality Degradation of Semiconductor Transistors by 1 MeV Electron Beam Exposure

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Publisher
한국원자력학회
Issue Date
1997-05
Language
KOR
Citation

한국원자력학회 학술발표회 , pp.401 - 406

URI
http://hdl.handle.net/10203/119378
Appears in Collection
NE-Conference Papers(학술회의논문)
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