Production Line Inspection of Precision Surfaces by Phase-Shifting Interferometry with Automatic Suppression of Phase Shift Errors
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Seung-Woo | - |
| dc.date.accessioned | 2013-03-15T12:04:07Z | - |
| dc.date.available | 2013-03-15T12:04:07Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1995-05-15 | - |
| dc.identifier.citation | Proc. of the 8th International Precision Engineering Seminar, v., no., pp.45 - 48 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/119302 | - |
| dc.language | ENG | - |
| dc.title | Production Line Inspection of Precision Surfaces by Phase-Shifting Interferometry with Automatic Suppression of Phase Shift Errors | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 45 | - |
| dc.citation.endingpage | 48 | - |
| dc.citation.publicationname | Proc. of the 8th International Precision Engineering Seminar | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
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