Prearation and characterizationof (Sr1-xTix)O3 and (Ba1-xSrx)TiO3 thin Films Using ECR Plasma Assiated MOCVD

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Publisher
MRS
Issue Date
1996-01-01
Language
ENG
Citation

Material Research Society Symposium Proc., pp.9 - 20

URI
http://hdl.handle.net/10203/118871
Appears in Collection
MS-Conference Papers(학술회의논문)
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