Prearation and characterizationof (Sr1-xTix)O3 and (Ba1-xSrx)TiO3 thin Films Using ECR Plasma Assiated MOCVD
- Publisher
- MRS
- Issue Date
- 1996-01-01
- Language
- ENG
- Citation
Material Research Society Symposium Proc., pp.9 - 20
- Appears in Collection
- MS-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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