Suppression of reverse bias tunneling current in HgCdTe photodiodes formed by rapid thermal diffusion
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, S.-M. | - |
| dc.contributor.author | Kim, J.-M. | - |
| dc.contributor.author | Lee, Hee Chul | - |
| dc.contributor.author | Kim, C.-K. | - |
| dc.date.accessioned | 2013-03-15T10:27:51Z | - |
| dc.date.available | 2013-03-15T10:27:51Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1997-04-20 | - |
| dc.identifier.citation | Infrared Technology and Applications XXIII, v.3061, no., pp.78 - 83 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/118654 | - |
| dc.language | ENG | - |
| dc.title | Suppression of reverse bias tunneling current in HgCdTe photodiodes formed by rapid thermal diffusion | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-58149263114 | - |
| dc.type.rims | CONF | - |
| dc.citation.volume | 3061 | - |
| dc.citation.beginningpage | 78 | - |
| dc.citation.endingpage | 83 | - |
| dc.citation.publicationname | Infrared Technology and Applications XXIII | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Lee, Hee Chul | - |
| dc.contributor.nonIdAuthor | Park, S.-M. | - |
| dc.contributor.nonIdAuthor | Kim, J.-M. | - |
| dc.contributor.nonIdAuthor | Kim, C.-K. | - |
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.