Rapid pattern inspection of shadow masks by machine vision integrated with Fourier optics

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 414
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorKim, Seung-Woo-
dc.contributor.authorLee Sang-Yoon-
dc.contributor.authorYoon Dong-Seon-
dc.contributor.authorHong Chul-Ki-
dc.contributor.authorHong Ji-Jung-
dc.date.accessioned2013-03-15T09:57:16Z-
dc.date.available2013-03-15T09:57:16Z-
dc.date.created2012-02-06-
dc.date.issued1997-01-29-
dc.identifier.citationProceedings of the 1997 Display Manufacturing Technology Conference, v., no., pp.19 - 20-
dc.identifier.urihttp://hdl.handle.net/10203/118453-
dc.languageENG-
dc.titleRapid pattern inspection of shadow masks by machine vision integrated with Fourier optics-
dc.typeConference-
dc.identifier.scopusid2-s2.0-0031385901-
dc.type.rimsCONF-
dc.citation.beginningpage19-
dc.citation.endingpage20-
dc.citation.publicationnameProceedings of the 1997 Display Manufacturing Technology Conference-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorKim, Seung-Woo-
dc.contributor.nonIdAuthorLee Sang-Yoon-
dc.contributor.nonIdAuthorYoon Dong-Seon-
dc.contributor.nonIdAuthorHong Chul-Ki-
dc.contributor.nonIdAuthorHong Ji-Jung-
Appears in Collection
ME-Conference Papers(학술회의논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0