DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cho Yong B. | - |
dc.contributor.author | Gweon, Dae-Gab | - |
dc.contributor.author | Yun Han J. | - |
dc.contributor.author | Lee Kyoung R. | - |
dc.date.accessioned | 2013-03-15T09:01:49Z | - |
dc.date.available | 2013-03-15T09:01:49Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1997-02-23 | - |
dc.identifier.citation | Proceedings of the NEPCON WEST'97. Part 3 (of 3), v.1, no., pp.71 - 77 | - |
dc.identifier.issn | 0470-0155 | - |
dc.identifier.uri | http://hdl.handle.net/10203/118073 | - |
dc.language | ENG | - |
dc.title | Development of axial laminographic system for electronic packaging inspection | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-0030683926 | - |
dc.type.rims | CONF | - |
dc.citation.volume | 1 | - |
dc.citation.beginningpage | 71 | - |
dc.citation.endingpage | 77 | - |
dc.citation.publicationname | Proceedings of the NEPCON WEST'97. Part 3 (of 3) | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Gweon, Dae-Gab | - |
dc.contributor.nonIdAuthor | Cho Yong B. | - |
dc.contributor.nonIdAuthor | Yun Han J. | - |
dc.contributor.nonIdAuthor | Lee Kyoung R. | - |
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