How to Measure the Machine Intelligence Quotient(MIQ) : Two Methods and Applications
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Bien, Zeung nam | - |
| dc.date.accessioned | 2013-03-15T08:49:12Z | - |
| dc.date.available | 2013-03-15T08:49:12Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1998 | - |
| dc.identifier.citation | WAC(World Automation Congress), v., no., pp.275 - 280 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/117993 | - |
| dc.language | ENG | - |
| dc.title | How to Measure the Machine Intelligence Quotient(MIQ) : Two Methods and Applications | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 275 | - |
| dc.citation.endingpage | 280 | - |
| dc.citation.publicationname | WAC(World Automation Congress) | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Bien, Zeung nam | - |
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