셀 손실확률의 측정을 통한 호연결수락제어 메카니즘

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DC FieldValueLanguage
dc.contributor.author성단근-
dc.contributor.author이주용-
dc.contributor.author변성혁-
dc.contributor.author허정원-
dc.contributor.author양진원-
dc.contributor.author이수종-
dc.date.accessioned2013-03-15T07:04:27Z-
dc.date.available2013-03-15T07:04:27Z-
dc.date.created2012-02-06-
dc.date.issued1997-
dc.identifier.citationJCCI'97, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/117201-
dc.languageKOR-
dc.title셀 손실확률의 측정을 통한 호연결수락제어 메카니즘-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameJCCI'97-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthor성단근-
dc.contributor.nonIdAuthor이주용-
dc.contributor.nonIdAuthor변성혁-
dc.contributor.nonIdAuthor허정원-
dc.contributor.nonIdAuthor양진원-
dc.contributor.nonIdAuthor이수종-
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EE-Conference Papers(학술회의논문)
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