DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cho, Kwang-Hyun | - |
dc.contributor.author | Lim, Jong-Tae | - |
dc.date.accessioned | 2013-03-15T05:26:54Z | - |
dc.date.available | 2013-03-15T05:26:54Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1997-07 | - |
dc.identifier.citation | 4th IFAC Workshop on Intelligent Manufacturing Systems, v., no., pp.197 - 202 | - |
dc.identifier.uri | http://hdl.handle.net/10203/116678 | - |
dc.language | ENG | - |
dc.publisher | IFAC | - |
dc.title | Failure Analysis and Diagnosis Using Discrete Event Models : Theory and Case Study | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 197 | - |
dc.citation.endingpage | 202 | - |
dc.citation.publicationname | 4th IFAC Workshop on Intelligent Manufacturing Systems | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Cho, Kwang-Hyun | - |
dc.contributor.localauthor | Lim, Jong-Tae | - |
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