Effect of CdTe stoichiometry on the electrical properties of CdTe films

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dc.contributor.authorChung, Gil Yongko
dc.contributor.authorSong, Jin Sooko
dc.contributor.authorAhn, Byung Taeko
dc.date.accessioned2013-03-15T03:33:00Z-
dc.date.available2013-03-15T03:33:00Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1996-04-08-
dc.identifier.citationProceedings of the MRS Spring Symposium, 1996, pp.385 - 390-
dc.identifier.issn0272-9172-
dc.identifier.urihttp://hdl.handle.net/10203/116072-
dc.languageEnglish-
dc.publisherMRS-
dc.titleEffect of CdTe stoichiometry on the electrical properties of CdTe films-
dc.typeConference-
dc.identifier.wosidA1996BG81U00054-
dc.identifier.scopusid2-s2.0-0030378482-
dc.type.rimsCONF-
dc.citation.beginningpage385-
dc.citation.endingpage390-
dc.citation.publicationnameProceedings of the MRS Spring Symposium, 1996-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationSan Francisco, CA, USA-
dc.contributor.localauthorAhn, Byung Tae-
dc.contributor.nonIdAuthorChung, Gil Yong-
dc.contributor.nonIdAuthorSong, Jin Soo-
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MS-Conference Papers(학술회의논문)
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