Characterization fo (Pb1-xLax)TiO3 Thin Films Crown by Radie-Frequency Magnetron Sputteringand Ther Elecrical Properties

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dc.contributor.authorKim, Ho Gi-
dc.date.accessioned2013-03-15T03:08:25Z-
dc.date.available2013-03-15T03:08:25Z-
dc.date.created2012-02-06-
dc.date.issued1998-
dc.identifier.citationIntegrated Ferroelectrics, v., no., pp.63 - 72-
dc.identifier.urihttp://hdl.handle.net/10203/115947-
dc.languageENG-
dc.titleCharacterization fo (Pb1-xLax)TiO3 Thin Films Crown by Radie-Frequency Magnetron Sputteringand Ther Elecrical Properties-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage63-
dc.citation.endingpage72-
dc.citation.publicationnameIntegrated Ferroelectrics-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorKim, Ho Gi-
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MS-Conference Papers(학술회의논문)
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