Characterization fo (Pb1-xLax)TiO3 Thin Films Crown by Radie-Frequency Magnetron Sputteringand Ther Elecrical Properties
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Ho Gi | - |
| dc.date.accessioned | 2013-03-15T03:08:25Z | - |
| dc.date.available | 2013-03-15T03:08:25Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1998 | - |
| dc.identifier.citation | Integrated Ferroelectrics, v., no., pp.63 - 72 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/115947 | - |
| dc.language | ENG | - |
| dc.title | Characterization fo (Pb1-xLax)TiO3 Thin Films Crown by Radie-Frequency Magnetron Sputteringand Ther Elecrical Properties | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 63 | - |
| dc.citation.endingpage | 72 | - |
| dc.citation.publicationname | Integrated Ferroelectrics | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Kim, Ho Gi | - |
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