Effects of post-implantation annealing on LWIR HgCdTe diode characteristics

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Issue Date
1998-07-19
Language
ENG
Citation

Proceedings of the 1998 Conference on Infrared Technology and Applications XXIV. Part 1 (of 2), v.3436, no.1, pp.104 - 109

URI
http://hdl.handle.net/10203/115566
Appears in Collection
EE-Conference Papers(학술회의논문)
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