High-Resolution Transmission Electron Microscopy of the Interfaces in Materials
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jeong Yong | - |
| dc.date.accessioned | 2013-03-15T01:15:12Z | - |
| dc.date.available | 2013-03-15T01:15:12Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1989-10-01 | - |
| dc.identifier.citation | 3rd Conf. on Materials and Material Properties-Principles and Applications of TEM and XRD, v., no., pp.5 - 5 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/115333 | - |
| dc.language | KOR | - |
| dc.title | High-Resolution Transmission Electron Microscopy of the Interfaces in Materials | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 5 | - |
| dc.citation.endingpage | 5 | - |
| dc.citation.publicationname | 3rd Conf. on Materials and Material Properties-Principles and Applications of TEM and XRD | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Lee, Jeong Yong | - |
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