High-Resolution Transmission Electron Microscopy of the Interfaces in Materials

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Issue Date
1989-10-01
Language
KOR
Citation

3rd Conf. on Materials and Material Properties-Principles and Applications of TEM and XRD, pp.5 - 5

URI
http://hdl.handle.net/10203/115333
Appears in Collection
MS-Conference Papers(학술회의논문)
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