미세패턴 측정을 위한 주사터널링현미경 원리의 응용An Application of Scanning Tunneling Microscopy for Measurement of Micro-Patterns
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정승배 | - |
| dc.contributor.author | 이용호 | - |
| dc.contributor.author | 김승우 | - |
| dc.date.accessioned | 2013-03-15T00:19:40Z | - |
| dc.date.available | 2013-03-15T00:19:40Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1993 | - |
| dc.identifier.citation | 대한기계학회 1993년 춘추학술대회, v.1, no.1, pp.771 - 774 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/114940 | - |
| dc.language | KOR | - |
| dc.publisher | 대한기계학회 | - |
| dc.title | 미세패턴 측정을 위한 주사터널링현미경 원리의 응용 | - |
| dc.title.alternative | An Application of Scanning Tunneling Microscopy for Measurement of Micro-Patterns | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.volume | 1 | - |
| dc.citation.issue | 1 | - |
| dc.citation.beginningpage | 771 | - |
| dc.citation.endingpage | 774 | - |
| dc.citation.publicationname | 대한기계학회 1993년 춘추학술대회 | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | 김승우 | - |
| dc.contributor.nonIdAuthor | 정승배 | - |
| dc.contributor.nonIdAuthor | 이용호 | - |
- Appears in Collection
- ME-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.