DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Joungho | - |
dc.contributor.author | Chan, Y. J. | - |
dc.contributor.author | Williamson, S. | - |
dc.contributor.author | Nees, J. | - |
dc.contributor.author | Wakana, S. | - |
dc.contributor.author | Whitaker, J. | - |
dc.contributor.author | Pavlidis, D. | - |
dc.date.accessioned | 2013-03-14T23:34:50Z | - |
dc.date.available | 2013-03-14T23:34:50Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1992 | - |
dc.identifier.citation | Technical Digest of 1992 IEEE GaAs IC Symposium, v., no., pp.19 - 22 | - |
dc.identifier.uri | http://hdl.handle.net/10203/114578 | - |
dc.language | ENG | - |
dc.title | Novel High-impedance photoconductive sampling probe for ultra-high speed circuit characterization | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 19 | - |
dc.citation.endingpage | 22 | - |
dc.citation.publicationname | Technical Digest of 1992 IEEE GaAs IC Symposium | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Kim, Joungho | - |
dc.contributor.nonIdAuthor | Chan, Y. J. | - |
dc.contributor.nonIdAuthor | Williamson, S. | - |
dc.contributor.nonIdAuthor | Nees, J. | - |
dc.contributor.nonIdAuthor | Wakana, S. | - |
dc.contributor.nonIdAuthor | Whitaker, J. | - |
dc.contributor.nonIdAuthor | Pavlidis, D. | - |
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