Abnormal Leakage Currents due to Inherent Stress-Inducing Defects in Thick-Film PtSi Schottky Diodes
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김충기 | - |
| dc.date.accessioned | 2013-03-14T22:25:04Z | - |
| dc.date.available | 2013-03-14T22:25:04Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1986 | - |
| dc.identifier.citation | Korea-Japan Joint Symposium on Electrical Material and Discharge, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/113987 | - |
| dc.language | KOR | - |
| dc.title | Abnormal Leakage Currents due to Inherent Stress-Inducing Defects in Thick-Film PtSi Schottky Diodes | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | Korea-Japan Joint Symposium on Electrical Material and Discharge | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | 김충기 | - |
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.