DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jeong, HD | ko |
dc.contributor.author | Lee, Yoon Sup | ko |
dc.contributor.author | Kim, Sehun | ko |
dc.date.accessioned | 2009-09-21T06:03:42Z | - |
dc.date.available | 2009-09-21T06:03:42Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1996-09 | - |
dc.identifier.citation | JOURNAL OF CHEMICAL PHYSICS, v.105, no.12, pp.5200 - 5207 | - |
dc.identifier.issn | 0021-9606 | - |
dc.identifier.uri | http://hdl.handle.net/10203/11376 | - |
dc.description.abstract | The adsorbed state of thiophene on Si(100)-(2X1) surface at 300 K has been investigated using low-energy electron diffraction (LEED), Auger electron spectroscopy (AES), and ultraviolet photoelectron spectroscopy (UPS). (2X1) LEED pattern at 300 K is sustained after the saturated exposure of thiophene, and the saturation coverage is estimated to be similar to 0.6 by AES, suggesting that thiophene molecule is chemisorbed molecularly on the Si(100) surface most likely by sigma bonds between C and Si atoms. UPS spectrum for the chemisorbed thiophene shows not only the pi orbital shift but also the sigma orbital shift. Semiempirical PM3 calculations based on the cluster model propose that the thiophene molecule adsorbs on the Si(100)-(2X1) surface by forming di-sigma bonds between C atoms of thiophene and Si atoms of the surface. (C) 1996 American Institute of Physics. | - |
dc.description.sponsorship | This research is, in part, supported by the Nondirected Research Fund, Korea Research Foundation and Center for Molecular Science. | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | ENERGY LOSS SPECTROSCOPY | - |
dc.subject | SILICON SURFACES | - |
dc.subject | ACETYLENE ADSORPTION | - |
dc.subject | THERMAL-DESORPTION | - |
dc.subject | DECOMPOSITION | - |
dc.subject | OPTIMIZATION | - |
dc.subject | DIFFRACTION | - |
dc.subject | SI(111)7X7 | - |
dc.subject | PARAMETERS | - |
dc.subject | ETHYLENE | - |
dc.title | Adsorbed state of thiophene on Si(100)-(2x1) surface studied by electron spectroscopic techniques and semiempirical methods | - |
dc.type | Article | - |
dc.identifier.wosid | A1996VJ72900027 | - |
dc.identifier.scopusid | 2-s2.0-0001439706 | - |
dc.type.rims | ART | - |
dc.citation.volume | 105 | - |
dc.citation.issue | 12 | - |
dc.citation.beginningpage | 5200 | - |
dc.citation.endingpage | 5207 | - |
dc.citation.publicationname | JOURNAL OF CHEMICAL PHYSICS | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Lee, Yoon Sup | - |
dc.contributor.localauthor | Kim, Sehun | - |
dc.contributor.nonIdAuthor | Jeong, HD | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | ENERGY LOSS SPECTROSCOPY | - |
dc.subject.keywordPlus | SILICON SURFACES | - |
dc.subject.keywordPlus | ACETYLENE ADSORPTION | - |
dc.subject.keywordPlus | THERMAL-DESORPTION | - |
dc.subject.keywordPlus | DECOMPOSITION | - |
dc.subject.keywordPlus | OPTIMIZATION | - |
dc.subject.keywordPlus | DIFFRACTION | - |
dc.subject.keywordPlus | SI(111)7X7 | - |
dc.subject.keywordPlus | PARAMETERS | - |
dc.subject.keywordPlus | ETHYLENE | - |
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