ANALYSIS OF CHEMICAL BONDING IN TIC, TIN, AND TIO USING 2ND-PRINCIPLES BAND STRUCTURES FROM PHOTOEMISSION DATA
- Publisher
- AMER INST PHYSICS
- Issue Date
- 1986
- Language
- English
- Article Type
- Meeting Abstract
- Citation
JOURNAL OF VACUUM SCIENCE TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.4, no.3, pp.1603 - 1603
- ISSN
- 0734-2101
- Appears in Collection
- CH-Journal Papers(저널논문)
- Files in This Item
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