Effects of Carrier-Velocity Saturation in the LDD Region on the Characteristics of Short Chanel LDD MOSFET

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dc.contributor.authorHong, Songcheol-
dc.contributor.authorLee, M-
dc.contributor.authorLee, J-
dc.contributor.authorKang, K-
dc.contributor.authorYoon, K-
dc.date.accessioned2013-03-14T19:52:57Z-
dc.date.available2013-03-14T19:52:57Z-
dc.date.created2012-02-06-
dc.date.issued1991-
dc.identifier.citationISDRS, v., no., pp.477 - 480-
dc.identifier.urihttp://hdl.handle.net/10203/112610-
dc.languageENG-
dc.titleEffects of Carrier-Velocity Saturation in the LDD Region on the Characteristics of Short Chanel LDD MOSFET-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage477-
dc.citation.endingpage480-
dc.citation.publicationnameISDRS-
dc.contributor.localauthorHong, Songcheol-
dc.contributor.nonIdAuthorLee, M-
dc.contributor.nonIdAuthorLee, J-
dc.contributor.nonIdAuthorKang, K-
dc.contributor.nonIdAuthorYoon, K-
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EE-Conference Papers(학술회의논문)
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