On-the-fly Circuits to Measure the Average Working Set Size

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dc.contributor.authorKwangkeun Yi-
dc.date.accessioned2013-03-14T17:41:59Z-
dc.date.available2013-03-14T17:41:59Z-
dc.date.created2012-02-06-
dc.date.issued1990-
dc.identifier.citationIEEE Int. Conf. on Computer Design: VLSI in Computers and Processors, v., no., pp.471 - 474-
dc.identifier.urihttp://hdl.handle.net/10203/111431-
dc.languageENG-
dc.titleOn-the-fly Circuits to Measure the Average Working Set Size-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage471-
dc.citation.endingpage474-
dc.citation.publicationnameIEEE Int. Conf. on Computer Design: VLSI in Computers and Processors-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorKwangkeun Yi-
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