On-the-fly Circuits to Measure the Average Working Set Size
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kwangkeun Yi | - |
| dc.date.accessioned | 2013-03-14T17:41:59Z | - |
| dc.date.available | 2013-03-14T17:41:59Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1990 | - |
| dc.identifier.citation | IEEE Int. Conf. on Computer Design: VLSI in Computers and Processors, v., no., pp.471 - 474 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/111431 | - |
| dc.language | ENG | - |
| dc.title | On-the-fly Circuits to Measure the Average Working Set Size | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 471 | - |
| dc.citation.endingpage | 474 | - |
| dc.citation.publicationname | IEEE Int. Conf. on Computer Design: VLSI in Computers and Processors | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Kwangkeun Yi | - |
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