Plasma-Etching induced Damage to Thin Oxide

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dc.contributor.authorHyung-Cheol Shin-
dc.date.accessioned2013-03-14T16:31:27Z-
dc.date.available2013-03-14T16:31:27Z-
dc.date.created2012-02-06-
dc.date.issued1992-
dc.identifier.citationIEEE/SEMI Advanced Semiconductor Manufacturing Conference, v., no., pp.79 - 83-
dc.identifier.urihttp://hdl.handle.net/10203/110778-
dc.languageENG-
dc.titlePlasma-Etching induced Damage to Thin Oxide-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage79-
dc.citation.endingpage83-
dc.citation.publicationnameIEEE/SEMI Advanced Semiconductor Manufacturing Conference-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorHyung-Cheol Shin-
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