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Comparative study of the ToF-SIMS, FT-IR and XPS techniques for quantitative analyses of mixed self-assembled monolayers Son, Jin Gyeong; Shon, Hyun Kyong; Choi, Changrok; Han, Sang Woo; Lee, Tae Geol, SURFACE AND INTERFACE ANALYSIS, v.46, pp.110 - 114, 2014-11 |
Label-Free Quantitative Analysis of Coacervates via 3D Phase Imaging Hong, Yuri; Dao, Khoi Phuong; Kim, Taehyun; Lee, Sumin; Shin, Yongdae; Park, YongKeun; Hwang, Dong Soo, ADVANCED OPTICAL MATERIALS, v.9, no.20, 2021-10 |
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