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Showing results 1 to 8 of 8

1
AC transport current loss analysis for a face-to-face stack of superconducting tapes

Yoo, Jaeun; Youm, Do-Jun; Oh, SangSoo, JOURNAL OF THE KOREA INSTITUTE OF APPLIED SUPERCONDUCTIVITY AND CRYOGENICS, v.15, no.2, pp.34 - 38, 2013-06

2
Calculation of AC magnetic losses from the experimental field profiles in a coated conductor under various external fields and temperatures

Yoo, Jaeun; Lee, SangMoo; Jung, YeHyun; Lee, Jaeyoung; Xuan, Dzung Nguyen; Youm, Do-Jun; Kim, Hosup; et al, IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, v.18, pp.1341 - 1344, 2008-06

3
Calculations of AC current losses and AC magnetic losses from the scanning Hall probe measurements for a coated conductor

Yoo, Jaeun; Lee, SangMoo; Jung, YeHyun; Lee, Jaeyoung; Youm, Do-Jun; Ko, Rock-Kil; Oh, SangSoo, PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, v.468, no.3, pp.160 - 168, 2008-02

4
Comparative Study on the Profiles of Intra-Granular Critical Current Density in SmBCO and YBCO Coated Conductors

Yoo, Jaeun; Lee, Sang-Moo; Jung, Ye-Hyun; Kwak, Kisung; Rhee, Joonkyu; Youm, Do-Jun; Kim, Hosup; et al, IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, v.19, no.3, pp.2843 - 2846, 2009-06

5
Data processing technique for data measured in MO image measurement system

Lee, Won Gi; Lee, Hyoyeon; Yoo, Jaeun; Youm, Do-Jun, Journal of the Korea Institute of Applied Superconductivity and Cryogenics, v.15, no.1, pp.25 - 28, 2013-03

6
Hysteretic Magnetization Curves of Coated Conductors Calculated Using Measured Field-Profile Data

Yoo, Jaeun; Lee, Jaeyoung; Youm, Do-Jun, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.53, pp.2160 - 2164, 2008-10

7
Magnetic relaxation with vortex creep observed by the magneto-optical image method for high Tc superconducting films

Lee, Won Gi; Lee, Jhinhwan; Youm, Dojun; Yoo, Jaeun, SUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.29, no.6, 2016-06

8
The effects of a magnetic field dependent critical current on the hysteresis loss of a coated conductor

Yoo, Jaeun; Lee, SangMoo; Jung, YeHyun; Lee, Jaeyoung; Xuan, DN; Youm, Do-Jun; Kim, Hosup; et al, SUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.21, 2008-08

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